Accelerated reliability screening of solid-state devices and components per EIA/JEDEC A110-B. Pressurised cylindrical workspace reaches absorption equilibrium in 24 hours instead of 1000.
The ENV-03-4 HAST chamber accelerates moisture-related reliability screening of semiconductors and electronics per EIA/JEDEC test method A110-B. By raising water vapour pressure inside a pressurised cylindrical workspace, moisture penetration becomes orders of magnitude faster than conventional 85 degC / 85% RH testing. Standard test points: 130 degC / 85% RH for 96 hours or 110 degC / 85% RH for 264 hours. Test duration can be calculated from accelerated reliability models.
| Model | Workspace | Static Load | Shelves |
|---|---|---|---|
| ENV-03-4 Standard | 50 cm dia x 40 cm length cylindrical, horizontal | Specify | 3 fixed |
| ENV-03-4-CB | Custom Built cylindrical workspace | Specify | Specify |
Pressurised cylindrical workspace with circular hand-locked door. Horizontal orientation.
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